DocumentCode
595102
Title
Locally linear embedding based example learning for pan-sharpening
Author
Qingjie Liu ; Lining Liu ; Yunhong Wang ; Zhaoxiang Zhang
Author_Institution
State Key Lab. of Virtual Reality Technol. & Syst, Beihang Univ., Beijing, China
fYear
2012
fDate
11-15 Nov. 2012
Firstpage
1928
Lastpage
1931
Abstract
In this paper, a novel example based method is proposed to solve the remote sensing pan-sharpening problem, utilizing an implicit non-parametric learning framework. The high resolution (HR) and down-sampled panchromatic (PAN) images are used to train the high/low resolution patch pair dictionaries. Based on the perspective of locally linear embedding (LLE), every patch in each multi-spectral (MS) image band is modeled by its K nearest neighbors in patch set generated from low resolution (LR) PAN image, and this model can be generalized to the HR condition. The intended HR MS patch is reconstructed from the corresponding neighbors in HR PAN patches. Finally, the HR MS images are recovered by stitching these patches together. Two datasets of images acquired by Quick-Bird satellite are used to test the performance of the proposed method. Experimental results show that the proposed method performs well in preserving spectral information as well as spatial details.
Keywords
geophysical image processing; image reconstruction; image resolution; image sampling; learning (artificial intelligence); remote sensing; HR MS image recovery; HR MS patch reconstruction; HR images; K nearest neighbors method; LLE; LR PAN image; MS image band; QuickBird satellite; down-sampled panchromatic images; example learning; example-based method; high resolution images; high resolution patch pair dictionary; implicit nonparametric learning framework; locally linear embedding; low resolution PAN image; low resolution patch pair dictionary; multispectral image band; patch set; remote sensing pan-sharpening problem; spectral information preservation; Image reconstruction; Principal component analysis; Remote sensing; Spatial resolution; Training; Vectors;
fLanguage
English
Publisher
ieee
Conference_Titel
Pattern Recognition (ICPR), 2012 21st International Conference on
Conference_Location
Tsukuba
ISSN
1051-4651
Print_ISBN
978-1-4673-2216-4
Type
conf
Filename
6460533
Link To Document