DocumentCode :
595174
Title :
Multiple local kernel integrated feature selection for image classification
Author :
Yu Sun ; Bhanu, Bir
Author_Institution :
Center for Res. in Intell. Syst., Univ. of California, Riverside, Riverside, CA, USA
fYear :
2012
fDate :
11-15 Nov. 2012
Firstpage :
2230
Lastpage :
2233
Abstract :
Feature redundancy and loss of local feature are central problems for image classification. Feature selection decreases the feature redundancy by choosing a subset of features and eliminating those with low prediction. The local feature representation is able to highlight objects in an image, thus, overcoming the drawbacks of global features. This paper presents a new method, called the local kernel for feature selection, which integrates a local kernel of the segmentation regions into feature selection to provide improved image classification, by means of the region-based image distance integrated into the kernel of the Bayesian classifier. The proposed method is tested on two standard image databases and the classification results are higher than the current feature selection and classification methods.
Keywords :
Bayes methods; feature extraction; image classification; image representation; redundancy; visual databases; Bayesian classifier; feature redundancy; feature subset; global features; image classification; local feature representation; multiple local kernel integrated feature selection; region-based image distance; standard image database; Bayesian methods; Equations; Feature extraction; Image classification; Image retrieval; Image segmentation; Kernel;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Pattern Recognition (ICPR), 2012 21st International Conference on
Conference_Location :
Tsukuba
ISSN :
1051-4651
Print_ISBN :
978-1-4673-2216-4
Type :
conf
Filename :
6460607
Link To Document :
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