DocumentCode
595204
Title
Placing landmarks suitably for shape analysis by optimization
Author
Iwata, Keiji
Author_Institution
Grad. Sch. of Inf. Sci., Hiroshima City Univ., Hiroshima, Japan
fYear
2012
fDate
11-15 Nov. 2012
Firstpage
2359
Lastpage
2362
Abstract
Shape analysis relies on using a finite number of points on the contour of an object to compare the shapes of objects. These points are called landmarks. Hence, when landmarks are not available for analysis, we must place some appropriately on the contour. In this paper, we describe a new method for placing landmarks well on the contours of objects in the same class. The landmarks located by our method are determined by solving an optimization problem. In experiments using line drawings, we demonstrate that our method places landmarks well on each drawing.
Keywords
optimisation; landmark placement; object contour; object shape comparison; optimization problem; shape analysis; Biology; Educational institutions; Estimation; Kernel; Optimization; Pattern recognition; Shape;
fLanguage
English
Publisher
ieee
Conference_Titel
Pattern Recognition (ICPR), 2012 21st International Conference on
Conference_Location
Tsukuba
ISSN
1051-4651
Print_ISBN
978-1-4673-2216-4
Type
conf
Filename
6460639
Link To Document