DocumentCode
595220
Title
Iris recognition using ordinal encoding of Log-Euclidean covariance matrices
Author
Peihua Li ; Guolong Wu
Author_Institution
Sch. of Comput. Sci. & Technol. & Sch. of Electr. Eng., Harbin Inst. of Technol., Harbin, China
fYear
2012
fDate
11-15 Nov. 2012
Firstpage
2420
Lastpage
2423
Abstract
Iris recognition in less constrained environments is challenging due to the degraded iris images. This paper proposes a novel method fusing multiple cues for iris recognition in the non-ideal imagery. The covariance matrices are used to represent local iris texture property, which capture the correlation of spatial coordinates, intensities, 1st and 2nd-order partial derivatives. The covariance matrices are symmetric positive definite (SPD) which form a Riemannian space rather than a Euclidean one. In the Log-Euclidean framework, the space of SPD matrices is equipped with a linear space structure so that in the logarithmic domain the Euclidean operations are applicable. This enables us to compute the logarithms of covariance matrices, leading to the Log-Euclidean covariance matrices (LECM), which can be handled in common Euclidean operations. The ordinal measure is further used to represent the order relation of iris texture by comparing LECMs at different positions. We finally perform iris matching based on the Hamming distance in which the noise effects are considered. Experiments on challenging databases show the effectiveness of the proposed method.
Keywords
Hamming codes; correlation theory; covariance matrices; image coding; image denoising; image fusion; image matching; image representation; image texture; iris recognition; Hamming distance; LECM; Log-Euclidean covariance matrix; Riemannian space; SPD matrices; image fusion; iris image matching; iris recognition; iris texture representation; linear space structure; logarithmic domain; noise effects; ordinal image encoding; spatial coordinate correlation; symmetric positive definite; Covariance matrix; Databases; Feature extraction; Iris recognition; Matrix decomposition; Pattern recognition; Symmetric matrices;
fLanguage
English
Publisher
ieee
Conference_Titel
Pattern Recognition (ICPR), 2012 21st International Conference on
Conference_Location
Tsukuba
ISSN
1051-4651
Print_ISBN
978-1-4673-2216-4
Type
conf
Filename
6460655
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