• DocumentCode
    59555
  • Title

    Differentiated Doping Profile for Vertical Terahertz GaN Transferred-Electron Devices

  • Author

    Dalle, Christophe Francois

  • Author_Institution
    Dept. Hyperfreq. et Semicond., Inst. d´Electron. de Microelectron. et de Nanotechnol., Villeneuve d´Ascq, France
  • Volume
    62
  • Issue
    3
  • fYear
    2015
  • fDate
    Mar-15
  • Firstpage
    802
  • Lastpage
    807
  • Abstract
    The potential of vertical differentiated gallium nitride (GaN) transferred electron devices (TEDs) is compared with that of the base flat doping profile TED for the realization of RF power sources at 1 THz. The TED oscillator modeling is a time-domain continuous wave pure sine model. The semiconductor device model is a 1-D numerical physical macroscopic model based on the energy-momentum approach. Differentiated structures of notch, detached notch, and P+ spike (PS) types have been optimized. By contrast with millimeter-wave differentiated TEDs operating in the dipole domain mode, the terahertz TED RF operating mode remains the accumulation layer/transit time mode. Comparison point out that the differentiated doping profile TEDs slightly improve both the TED RF performance and electronic limitation but above all improve the thermal limitation resulting from the high dc bias conditions due to high threshold electric field in GaN. Thus, the PS TED distinguishes itself as the most promising structure.
  • Keywords
    Gunn devices; III-V semiconductors; doping profiles; gallium compounds; semiconductor device models; semiconductor doping; terahertz wave devices; wide band gap semiconductors; 1D numerical physical macroscopic model; GaN; P+ spike type notch; TED oscillator modeling; detached notch; differentiated doping profile; dipole domain mode; energy-momentum approach; frequency 1 THz; millimeter-wave differentiated TEDs; semiconductor device model; terahertz TED; time-domain continuous wave pure sine model; vertical terahertz transferred-electron devices; Doping; Gallium nitride; Oscillators; Performance evaluation; Radio frequency; Resistance; Semiconductor process modeling; Differentiated doping profile; fundamental accumulation layer and transit time operating mode; time-domain energy-momentum modeling; vertical terahertz gallium nitride (GaN) transferred electron device (TED); vertical terahertz gallium nitride (GaN) transferred electron device (TED).;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/TED.2015.2392158
  • Filename
    7036082