Title :
Design to phase measurement profilometry on grating projection system
Author :
Jie Xu ; Jun Xu ; Xiaoyang Yu
Author_Institution :
Heilongjiang Inst. of Sci. & Technol., Harbin Univ. of Sci. & Technol., Harbin, China
Abstract :
Phase measuring profilometry is an important measurement method of the optical 3D measurement system, in which the projector is used in the grating fringe projection. Then there are some shortcomings to the projector used in the projection process. In this paper, the physical grating equipment based on the design of a projection is designed and structural parameter to filming machine is optimized. It indicated that the new method is effective method to overcome the projector appear to improve the measurement accuracy.
Keywords :
diffraction gratings; optical projectors; optical variables measurement; phase measurement; filming machine; grating projection system; optical 3D measurement system; phase measurement profilometry design; physical grating equipment; structural parameter; Accuracy; Cameras; Gratings; Lenses; Optical imaging; Optical variables measurement; Phase measurement;
Conference_Titel :
Advanced Computational Intelligence (ICACI), 2012 IEEE Fifth International Conference on
Conference_Location :
Nanjing
Print_ISBN :
978-1-4673-1743-6
DOI :
10.1109/ICACI.2012.6463336
