Title :
Sense/drive architecture for CMOS-MEMS accelerometers with relaxation oscillator and TDC
Author :
Michalik, Peter ; Madrenas, J. ; Fernandez, Diego
Author_Institution :
Electron. Eng. Dept., Univ. Politec. de Catalunya, Barcelona, Spain
Abstract :
This paper reports a mixed-signal architecture for capacitive accelerometers conditioning based on capacitance ratio to frequency conversion and high-precision digital frequency demodulation with coarse-fine time-to-digital converter (TDC) and delay-locked loop (DLL). Furthermore, the front-end has a capability to apply pulse-controlled electrostatic actuation which can be used for the accelerometer self-test or for closed-loop operation if an external digital feedback controller is added. Since the design is dominated by standard digital circuitry, the presented concept allows rapid prototyping, what is especially important in case of microsensors monolithically integrated in advanced CMOS processes where classic analog circuits are difficult to scale-down.
Keywords :
CMOS analogue integrated circuits; accelerometers; closed loop systems; delay lock loops; frequency convertors; microsensors; mixed analogue-digital integrated circuits; relaxation oscillators; time-digital conversion; CMOS-MEMS accelerometers; DLL; TDC; accelerometer self-test; advanced CMOS processes; capacitance ratio; capacitive accelerometers; classic analog circuits; closed-loop operation; coarse-fine time-to-digital converter; delay-locked loop; external digital feedback controller; frequency conversion; high-precision digital frequency demodulation; microsensors; mixed-signal architecture; pulse-controlled electrostatic actuation; rapid prototyping; relaxation oscillator; sense-drive architecture; standard digital circuitry; Accelerometers; Adaptive control; Current measurement; Demodulation; Electrostatic actuators; Mechanical variables measurement; Micromechanical devices; Accelerometer; CMOS-MEMS; Inertial Sensor; Relaxation Oscillator; Surface Micro-machining; TDC; Tapped Delay Line; Time-to-Digital Converter;
Conference_Titel :
Electronics, Circuits and Systems (ICECS), 2012 19th IEEE International Conference on
Conference_Location :
Seville
Print_ISBN :
978-1-4673-1261-5
Electronic_ISBN :
978-1-4673-1259-2
DOI :
10.1109/ICECS.2012.6463507