DocumentCode :
596796
Title :
A low noise high dynamic range analog front-end ASIC for the AGIPD XFEL detector
Author :
Xintian Shi ; Dinapoli, R. ; Greiffenberg, D. ; Henrich, B. ; Mozzanica, A. ; Schmitt, Benoit ; Kruger, Heinrich ; Graafsma, Heinz ; Klyuev, A. ; Marras, A. ; Trunk, U.
Author_Institution :
Paul Scherrer Inst., Villigen, Switzerland
fYear :
2012
fDate :
9-12 Dec. 2012
Firstpage :
933
Lastpage :
936
Abstract :
In this paper we present a low noise high dynamic range analog front-end ASIC designed for the Adaptive Gain Integrating Pixel Detector (AGIPD) being developed for the European X-ray Free Electron Laser (XFEL) facility. The ASIC has 64 × 64 pixels with a pixel size of 200 × 200 μm2, and is bump bonded to a silicon sensor for X-ray imaging. Each pixel includes an adaptive gain charge integrating amplifier (AGCIA) and 352 analog storage cells. The gain of the AGCIA dynamically adapts to the number of photons arriving at the sensor in order to achieve a single photon resolution and a dynamic range of more than 104 12 keV photons. The XFEL bunch trains consist of up to 2700 bunches separated by 220 ns (600 us in total) followed by an idle time of 99.4 ms. The AGCIA operates in a 220 ns repeating cycle by storing images and the gain information into the pixel memory during the pulse train. The stored images are read out during the breaks of the bunch trains. Several prototypes are designed and fabricated in IBM 130 nm CMOS technology. The measurements showed an input equivalent noise charge (ENC) lower than 300 e- and a dynamic range of 7000 photons.
Keywords :
CMOS analogue integrated circuits; CMOS image sensors; X-ray imaging; amplifiers; application specific integrated circuits; free electron lasers; image resolution; integrated circuit noise; AGCIA; AGIPD XFEL detector; ENC; European X-ray free electron laser; IBM CMOS technology; X-ray imaging; XFEL facility; adaptive gain charge integrating amplifier; adaptive gain integrating pixel detector; analog storage cell; bump bonded; bunch trains; equivalent noise charge; gain information; low noise high dynamic range analog front-end ASIC; photon resolution; pixel memory; pixel size; pulse train; silicon sensor; size 130 nm; Application specific integrated circuits; Detectors; Dynamic range; Europe; Gain; Noise; Photonics;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronics, Circuits and Systems (ICECS), 2012 19th IEEE International Conference on
Conference_Location :
Seville
Print_ISBN :
978-1-4673-1261-5
Electronic_ISBN :
978-1-4673-1259-2
Type :
conf
DOI :
10.1109/ICECS.2012.6463508
Filename :
6463508
Link To Document :
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