DocumentCode :
596819
Title :
CMOS Active Column Sensor for biodetection applications based on Surface Plasmon Resonance
Author :
Salazar, Addisson ; Camacho-Leon, S. ; Martinez-Chapa, S.O. ; Rossetto, Olivier
Author_Institution :
Dept. of Electr. & Comput. Eng., Tecnol. de Monterrey, Monterrey, Mexico
fYear :
2012
fDate :
9-12 Dec. 2012
Firstpage :
821
Lastpage :
824
Abstract :
A CMOS Active Column Sensor (ACS) with FPN noise reduction is developed for Surface Plasmon Resonance (SPR) biosensing applications. For a SPR interface where the materials are compatible with a post-CMOS fabrication process a 68° coupling angle and a reflectance change of 75% are obtained. Furthermore, these materials provide the possibility of integration with the rest of the elements in an SPR biosensor in a single chip, including a CMOS ACS for the photodetection stage. The 20 × 20 μm2 pixel uses a n-well/p-sub photodiode, three transistors (3T) configuration, with a 61% fill factor and 5.2 μV/e- conversion gain. Non Correlated Double sampling (NCDS) and double delta sampling (DDS) schemes are implemented for noise handling, where a Monte Carlo analysis shows a reduction of the output´s variance.
Keywords :
CMOS integrated circuits; Monte Carlo methods; biomedical electronics; biosensors; circuit noise; photodetectors; reflectivity; sampling methods; surface plasmon resonance; transistor circuits; 3T configuration; CMOS ACS; CMOS active column sensor; DDS; FPN noise reduction; Monte Carlo analysis; NCDS; SPR biosensing application; SPR biosensor; SPR interface; biodetection application; coupling angle; double delta sampling; fill factor; n-well/p-sub photodiode; noise handling; noncorrelated double sampling; output variance; photodetection; post-CMOS fabrication process; reflectance change; surface plasmon resonance; three transistors configuration; Arrays; Biosensors; CMOS integrated circuits; Photodiodes; Plasmons; Reflectivity; Transistors;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronics, Circuits and Systems (ICECS), 2012 19th IEEE International Conference on
Conference_Location :
Seville
Print_ISBN :
978-1-4673-1261-5
Electronic_ISBN :
978-1-4673-1259-2
Type :
conf
DOI :
10.1109/ICECS.2012.6463533
Filename :
6463533
Link To Document :
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