• DocumentCode
    596958
  • Title

    Electrical characterization of a C-Element with LiChEn

  • Author

    Moreira, Matheus T. ; Calazans, Ney L. V.

  • Author_Institution
    Fac. of Comput. Sci., Pontifical Catholic Univ. of Rio Grande do Sul, Porto Alegre, Brazil
  • fYear
    2012
  • fDate
    9-12 Dec. 2012
  • Firstpage
    583
  • Lastpage
    585
  • Abstract
    This demonstration presents the use of the Library Characterization Environment (LiChEn) for characterizing asynchronous standard cells. The tool was employed for the electrical characterization of a library with over five hundred asynchronous standard cells. In this work, a case study of a fundamental asynchronous component, the C-Element, will be presented to validate the use of the tool. LiChEn was designed due to the necessity of automating the process of characterizing asynchronous standard cells. Albeit this task can be done with tools from industrial EDA vendors, the use of these proved to require laborious manual work. These tools were designed for characterizing standard cells for synchronous systems and usually fail to recognize complex asynchronous logic. Moreover, asynchronous components are not available off the shelf in typical standard cell libraries, which constrains the asynchronous paradigm for full-custom approaches. As asynchronous techniques gain relevance in the research community, LiChEn can present a practical solution for a wider adoption of such techniques, by allowing an automated characterization of asynchronous standard cells.
  • Keywords
    asynchronous circuits; C-element; LiChEn; asynchronous components; asynchronous paradigm; asynchronous standard cells; asynchronous techniques; automated characterization; complex asynchronous logic; electrical characterization; full-custom approaches; fundamental asynchronous component; industrial EDA vendors; library characterization environment; process automation; research community; standard cell library; synchronous systems; Asynchronous circuits; Capacitance; Delay; Libraries; Load modeling; SPICE; Standards;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronics, Circuits and Systems (ICECS), 2012 19th IEEE International Conference on
  • Conference_Location
    Seville
  • Print_ISBN
    978-1-4673-1261-5
  • Electronic_ISBN
    978-1-4673-1259-2
  • Type

    conf

  • DOI
    10.1109/ICECS.2012.6463680
  • Filename
    6463680