Title :
The effect of topology on life time of SMPS
Author :
Rahmani, Amine ; Abdi, B. ; Yazdanparast, L.
Author_Institution :
Damavand Branch, Islamic Azad Univ., Tehran, Iran
Abstract :
Recently, life time is one of the serious requirements of electronic systems. The numbers of system failures, repair cost, guarantee, etc are estimated by life time estimation. In this paper, the reliability of a switching power supplies is evaluated. It will show that the most of failure rates depends on power circuit which it is named topology. Reliability of two different topologies, including half-bridge and flyback, will be discussed in this paper. It will be shown that flyback topology has better reliability during less power parts.
Keywords :
network topology; power supply circuits; reliability; SMPS lifetime estimation; electronic systems; flyback topology effect; power circuit; switch mode power supplies; Capacitors; Integrated circuit reliability; Power supplies; Stress; Switches; Topology; Life time; Reliability; SMPS; Topology;
Conference_Titel :
Electrical and Power Engineering (EPE), 2012 International Conference and Exposition on
Conference_Location :
Iasi
Print_ISBN :
978-1-4673-1173-1
DOI :
10.1109/ICEPE.2012.6463820
