DocumentCode
597086
Title
The effect of topology on life time of SMPS
Author
Rahmani, Amine ; Abdi, B. ; Yazdanparast, L.
Author_Institution
Damavand Branch, Islamic Azad Univ., Tehran, Iran
fYear
2012
fDate
25-27 Oct. 2012
Firstpage
891
Lastpage
893
Abstract
Recently, life time is one of the serious requirements of electronic systems. The numbers of system failures, repair cost, guarantee, etc are estimated by life time estimation. In this paper, the reliability of a switching power supplies is evaluated. It will show that the most of failure rates depends on power circuit which it is named topology. Reliability of two different topologies, including half-bridge and flyback, will be discussed in this paper. It will be shown that flyback topology has better reliability during less power parts.
Keywords
network topology; power supply circuits; reliability; SMPS lifetime estimation; electronic systems; flyback topology effect; power circuit; switch mode power supplies; Capacitors; Integrated circuit reliability; Power supplies; Stress; Switches; Topology; Life time; Reliability; SMPS; Topology;
fLanguage
English
Publisher
ieee
Conference_Titel
Electrical and Power Engineering (EPE), 2012 International Conference and Exposition on
Conference_Location
Iasi
Print_ISBN
978-1-4673-1173-1
Type
conf
DOI
10.1109/ICEPE.2012.6463820
Filename
6463820
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