• DocumentCode
    597231
  • Title

    Stigmergic search with Single Electron Tunneling technology based Memory Enhanced Hubs

  • Author

    Safiruddin, S. ; Cotofana, Sorin ; Peper, Ferdinand

  • Author_Institution
    Fac. of EE, Delft Univ. of Technol., Delft, Netherlands
  • fYear
    2012
  • fDate
    4-6 July 2012
  • Firstpage
    174
  • Lastpage
    180
  • Abstract
    Fluctuations have recently been recognized as powerful resources that can be exploited to drive computations, but their use has mostly been limited to logic circuits. This paper goes further and explores a more general framework, in which computation is modeled as a process with a multitude of fluctuating tokens that interact with each other directly or via stigmergy. For the implementation of these concepts Single Electron Tunneling (SET) technology is a strong candidate, since it combines a key element of fluctuation-driven systems, i.e., fluctuating tokens, with the potential for manufacturing in traditional materials (silicon) as well as alternatives, such as molecules. We propose computational elements, i.e., Memory Enhanced Hubs (MEHs), that contain functionality to pass fluctuating signals through them, as well as stigmergic functionality to store a state temporarily and reset it. We introduce a SET based design of such a memory enhance hub instance and demonstrate by means of simulations that it function correctly and that MEHs networks operating according to the stigmergic paradigm can be constructed.
  • Keywords
    elemental semiconductors; fluctuations; logic circuits; silicon; single electron devices; Si; computational elements; fluctuating tokens; fluctuation-driven systems; logic circuits; memory enhanced hubs; silicon; single electron tunneling technology; stigmergic functionality; stigmergic search; Context; Electric potential; Encoding; Integrated circuit modeling; Junctions; Stochastic processes; Tunneling;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nanoscale Architectures (NANOARCH), 2012 IEEE/ACM International Symposium on
  • Conference_Location
    Amsterdam
  • Print_ISBN
    978-1-4503-1671-2
  • Type

    conf

  • Filename
    6464160