• DocumentCode
    5973
  • Title

    Continuation-Based Pull-In and Lift-Off Simulation Algorithms for Microelectromechanical Devices

  • Author

    Zheng Zhang ; Kamon, M. ; Daniel, Luca

  • Author_Institution
    Dept. of Electr. Eng. & Comput. Sci., Massachusetts Inst. of Technol., Cambridge, MA, USA
  • Volume
    23
  • Issue
    5
  • fYear
    2014
  • fDate
    Oct. 2014
  • Firstpage
    1084
  • Lastpage
    1093
  • Abstract
    The voltages at which microelectromechanical actuators and sensors become unstable, known as pull-in and lift-off voltages, are critical parameters in microelectromechanical systems (MEMS) design. The state-of-the-art MEMS simulators compute these parameters by simply sweeping the voltage, leading to either excessively large computational cost or to convergence failure near the pull-in or lift-off points. This paper proposes to simulate the behavior at pull-in and lift-off employing two continuation-based algorithms. The first algorithm appropriately adapts standard continuation methods, providing a complete set of static solutions. The second algorithm uses continuation to trace two kinds of curves and generates the sweep-up or sweep-down curves, which can provide more intuition for MEMS designers. The algorithms presented in this paper are robust and suitable for general-purpose industrial MEMS designs. Our algorithms have been implemented in a commercial MEMS/integrated circuits codesign tool, and their effectiveness is validated by comparisons against measurement data and the commercial finite-element/boundary-element (FEM/BEM) solver CoventorWare.
  • Keywords
    boundary-elements methods; finite element analysis; micromechanical devices; CoventorWare finite-element-boundary-element solver; MEMS simulators; continuation based lift-off simulation algorithm; continuation based pull-in simulation algorithm; general purpose industrial MEMS designs; integrated circuits codesign tool; microelectromechanical devices; Algorithm design and analysis; Computational modeling; Mathematical model; Micromechanical devices; Solid modeling; Stability analysis; Standards; MEMS CAD; continuation; continuation.; lift-off; pull-in;
  • fLanguage
    English
  • Journal_Title
    Microelectromechanical Systems, Journal of
  • Publisher
    ieee
  • ISSN
    1057-7157
  • Type

    jour

  • DOI
    10.1109/JMEMS.2014.2304967
  • Filename
    6748897