Title :
Optimization model selection for simulation-based approximate dynamic programming approaches in semiconductor manufacturing operations
Author :
Xiaoting Chen ; Fernandez, Eduardo ; Kelton, W. David
Author_Institution :
Sch. of Electron. & Comput. Syst., Univ. of Cincinnati, Cincinnati, OH, USA
Abstract :
Guided by Little´s law, decision and control models for operations in reentrant line manufacturing (RLM) systems are commonly set up to minimize the total work-in-process (WIP), which in turn indirectly minimizes cycle time (CT). By viewing the problem fundamentally differently, we re-formulate it as one that seeks to select the best cost function leading to optimal cycle times. We present the details and results of an extended simulation study, based on a benchmark problem, using a simulation-based approximate dynamic programming method, with a newly proposed extended actor-critic architecture. Our results support the idea that a Markov decision process modeling approach can be used as a flexible platform to explore different cost formulations, leading to a selection of an optimal cost and model to optimize cycle time directly.
Keywords :
Markov processes; dynamic programming; manufacturing systems; semiconductor industry; simulation; Little law; Markov decision process modeling approach; benchmark problem; control models; decision models; extended actor-critic architecture; optimal cycle times; optimization model selection; reentrant line manufacturing systems; semiconductor manufacturing operations; simulation-based approximate dynamic programming approaches; simulation-based approximate dynamic programming method; work-in-process; Computational modeling; Cost function; Dynamic programming; Markov processes; Measurement; Semiconductor device modeling;
Conference_Titel :
Simulation Conference (WSC), Proceedings of the 2012 Winter
Conference_Location :
Berlin
Print_ISBN :
978-1-4673-4779-2
Electronic_ISBN :
0891-7736
DOI :
10.1109/WSC.2012.6465138