• DocumentCode
    597434
  • Title

    Tutorial: Illusion of capacity — Challenge of incorporating the complexity of FAB capacity (tool deployment & operating curve) into central planning for firms with substantial non-fab complexity

  • Author

    Fordyce, K. ; Fournier, Jacques ; Milne, R.J. ; Singh, Harshavardhan

  • Author_Institution
    IBM, Essex Junction, VT, USA
  • fYear
    2012
  • fDate
    9-12 Dec. 2012
  • Firstpage
    1
  • Lastpage
    16
  • Abstract
    Since the early 1990s, organizations have focused on making smarter decisions in their integrated supply chain central planning, but the representation of capacity and cycle time has remained static and linear in contrast to its complex nature. This includes central planning for firms with semiconductor fabrication facilities (FABS) as a component of a complex demand supply network(DSN) where much of the complexity is non-FAB. Developing more intelligent solutions for capacity in central planning within computational and process limitations is a critical challenge. For DSNs with FABS, twin challenges are tool deployment and the operating curve. Many in the FAB community are aware of these complexities; options proposed and some implemented within “aggregate FAB planning,” rarely within central planning. This tutorial reviews the current state of central planning with respect to capacity and cycle time, outlines the challenges these complexities place on central planning structures, and indicates possible solutions.
  • Keywords
    strategic planning; supply chain management; FAB capacity; central planning structures; complex demand supply network; nonfab complexity; semiconductor fabrication facility; supply chain central planning; Aggregates; Capacity planning; Complexity theory; Equations; Manufacturing; Mathematical model; Planning;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Simulation Conference (WSC), Proceedings of the 2012 Winter
  • Conference_Location
    Berlin
  • ISSN
    0891-7736
  • Print_ISBN
    978-1-4673-4779-2
  • Electronic_ISBN
    0891-7736
  • Type

    conf

  • DOI
    10.1109/WSC.2012.6465207
  • Filename
    6465207