DocumentCode
597642
Title
Copper oxide based low cost thin film solar cells
Author
Kumar, Vipin ; Masudy-Panah, S. ; Tan, Chiu C. ; Wong, T.K.S. ; Chi, D.Z. ; Dalapati, Goutam Kumar
Author_Institution
Sch. of Electr. & Electron. Eng., Nanyang Technol. Univ., Singapore, Singapore
fYear
2013
fDate
2-4 Jan. 2013
Firstpage
443
Lastpage
445
Abstract
Copper oxide is one of the earliest semiconductor materials investigated for solar cells in the early 1900´s before silicon cells became widespread. It is environmentally friendly, nontoxic and furthermore copper is an abundant metal. In spite of having low power conversion efficiencies when compared to theoretical values, there is much scope to further improve the efficiency. Copper oxide exists in two stable forms namely, CuO and Cu2O with a direct band gap in each case. The band gap can be tuned between 1.6 eV (CuO) to 2.3 eV (Cu2O). In the present work, semiconducting copper oxide have been deposited on glass and (100) silicon substrates by using radio frequency (RF) sputtering technique with a CuO target in argon ambient. After deposition, thermal annealing treatment was carried out at different temperatures ranging from 300°C to 550°C in rapid thermal annealing (RTA) system. The structural properties and composition of the deposited films have been studied by using X-ray diffraction and X-ray photoelectron spectroscopy analysis. Optical and electrical properties were studied by using UV-Vis spectrophotometer and current-voltage (I-V) characteristics. The band gap of ~1.6 eV was obtained for sputtered CuO oxide after annealing at 300°C. Hetero-junction solar cells was fabricated using p-type CuO and n-type Si(100) substrates. The I-V characteristics of hetero-junction solar cell under sunlight of air mass 1.5 and 100 mW/cm2 illumination shows open circuit voltage of ~380 mV and short-circuit current of ~ 1 mA/cm2.
Keywords
X-ray diffraction; X-ray photoelectron spectra; annealing; copper compounds; energy gap; photoelectron spectroscopy; power conversion; semiconductor heterojunctions; semiconductor thin films; short-circuit currents; solar cells; sputter deposition; ultraviolet spectra; visible spectra; CuO-Si; I-V characteristics; RF sputtering technique; RTA system; Si; UV-Vis spectrophotometer; X-ray diffraction analysis; X-ray photoelectron spectroscopy analysis; air mass; argon; band gap; copper oxide based low cost thin film solar cells; current-voltage characteristics; electrical properties; electron volt energy 1.6 eV to 2.3 eV; glass; hetero-junction solar cell; low power conversion efficiency; n-type Si substrate; open circuit voltage; optical properties; p-type Si substrate; radio frequency sputtering technique; rapid thermal annealing; semiconductor materials; short-circuit current; silicon substrates; sunlight; temperature 300 degC to 550 degC; Annealing; Copper; Optical device fabrication; Optical films; Photonic band gap; Photovoltaic cells; CuO; Hetero-junction solar cells; Low cost thin film solar cells;
fLanguage
English
Publisher
ieee
Conference_Titel
Nanoelectronics Conference (INEC), 2013 IEEE 5th International
Conference_Location
Singapore
ISSN
2159-3523
Print_ISBN
978-1-4673-4840-9
Electronic_ISBN
2159-3523
Type
conf
DOI
10.1109/INEC.2013.6466072
Filename
6466072
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