Title :
Embedded double matching of local descriptors for a fast automatic recognition of real-world objects
Author :
Alqaisi, T. ; Gledhill, D. ; Olszewska, J.I.
Author_Institution :
Sch. of Comput. & Eng., Univ. of Huddersfield, Huddersfield, UK
fDate :
Sept. 30 2012-Oct. 3 2012
Abstract :
In this paper, we present a new approach for matching local descriptors such as Scale Invariant Feature Transform (SIFT) ones in order to recognize image objects quickly and reliably. The proposed method first computes the Hausdorff distance combined with the City-Block distance to match the two sets of the extracted keypoints from the goal and data images, respectively. Then, the matched points are involved into an embedded pairing process, leading to a double matching which is more discriminant for the object recognition purpose as demonstrated on real-world standard databases.
Keywords :
embedded systems; feature extraction; image matching; object recognition; visual databases; City-Block distance; Hausdorff distance; data images; embedded double matching; embedded pairing process; fast automatic recognition; image object recognition; keypoint extraction; local descriptor matching; real-world objects; real-world standard databases; Computer vision; Conferences; Databases; Euclidean distance; Feature extraction; Object recognition; Robustness; City-Block Distance; Euclidean Distance; Feature Matching; Hausdorff Distance; Interest Points; Object Recognition; SIFT; Similarity Measure;
Conference_Titel :
Image Processing (ICIP), 2012 19th IEEE International Conference on
Conference_Location :
Orlando, FL
Print_ISBN :
978-1-4673-2534-9
Electronic_ISBN :
1522-4880
DOI :
10.1109/ICIP.2012.6467377