DocumentCode :
59882
Title :
Experimental Benchmark of Electron Trajectory Reconstruction Algorithm for Advanced Compton Imaging
Author :
Plimley, B. ; Chivers, D. ; Coffer, A. ; Vetter, K.
Author_Institution :
Univ. of California, Berkeley, Berkeley, CA, USA
Volume :
60
Issue :
3
fYear :
2013
fDate :
Jun-13
Firstpage :
2308
Lastpage :
2313
Abstract :
Electron-tracking-based Compton imaging of gamma rays reduces the background level of the backprojected Compton image through the additional measurement of the initial momentum vector of the Compton electron. This reduction in image background has the potential for the detection of weaker sources in a complex background radiation field. Electron-tracking-based Compton imaging was demonstrated recently in solid-state detectors through the use of scientific Si charge-coupled devices (CCDs) with excellent position and energy resolution characteristics. In addition, the sensitivity of the electron track reconstruction algorithm has been evaluated extensively on the modeled detector response to Monte-Carlo electron tracks. We have now benchmarked the modeled algorithm sensitivity with our experimentally observed algorithm sensitivity, by measuring CCD electron tracks from a collimated 662 keV gamma-ray source in coincidence with a position-sensitive HPGe detector. For all coincident events the electron momentum vector deduced by the reconstruction algorithm is compared to the electron momentum vector calculated from the measured positions. This measured distribution of angular error of the algorithm agrees well with the angular error distribution calculated from our electron transport and detector models.
Keywords :
CCD image sensors; Compton effect; Monte Carlo methods; benchmark testing; gamma-ray apparatus; Monte Carlo electron track; advanced Compton imaging; backprojected Compton image; benchmark; charge coupled device; coincident event; electron tracking based Compton imaging; electron trajectory reconstruction algorithm; gamma rays; initial momentum vector; solid state detectors; Charge coupled devices; Detectors; Energy resolution; Semiconductor device measurement; Sensitivity; Vectors; Charge coupled devices; Compton imaging; gamma-ray cameras; gamma-ray detectors; radiation imaging; semiconductor radiation detectors; silicon radiation detectors; solid state tracking detectors; tracking detectors;
fLanguage :
English
Journal_Title :
Nuclear Science, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9499
Type :
jour
DOI :
10.1109/TNS.2013.2254498
Filename :
6515713
Link To Document :
بازگشت