DocumentCode :
599922
Title :
Structural and optical properties of H implanted ZnO
Author :
Chan, Kheong Sann ; Ye, J.D. ; Parkinson, P. ; Monakhov, E. ; Johansen, K.M. ; Vines, L. ; Svensson, B.G. ; Jagadish, C. ; Wong-Leung, J.
Author_Institution :
Dept. of Electron. Mater. Eng., Australian Nat. Univ., Canberra, ACT, Australia
fYear :
2012
fDate :
12-14 Dec. 2012
Firstpage :
219
Lastpage :
220
Abstract :
ZnO is a wide bandgap semiconductor with huge potential to fabricate optoelectronic devices operating in the UV region. However, it is still not possible to achieve p-type ZnO, with hydrogen suggested to be a shallow donor that contributes significantly to the n-type conductivity in as grown ZnO. A better understanding on the role of H in ZnO is needed to realise p-type doping in ZnO. In this research, we utilised multiple structural and optical techniques to study the effects caused by H implantation in ZnO. The H implanted region in single crystal ZnO substrate was characterised by X-Ray diffraction, photoluminescence spectroscopy, secondary ion mass spectroscopy and transmission electron microscopy. XRD results show that H implantation created deformed layers with strain increasing linearly with implantation dose. A blue shift is also observed from the UV photoluminescence emission of the H implanted ZnO.
Keywords :
II-VI semiconductors; X-ray diffraction; ion implantation; photoluminescence; secondary ion mass spectroscopy; semiconductor doping; transmission electron microscopy; wide band gap semiconductors; zinc compounds; UV photoluminescence emission; UV region; X-ray diffraction; XRD; ZnO:H; blue shift; deformed layer; implantation dose; n-type conductivity; optical property; optical technique; optoelectronic device; p-type doping; photoluminescence spectroscopy; secondary ion mass spectroscopy; structural property; structural technique; transmission electron microscopy; wide bandgap semiconductor; Annealing; Doping; Hydrogen; Optical diffraction; Temperature measurement; X-ray scattering; Zinc oxide;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Optoelectronic and Microelectronic Materials & Devices (COMMAD), 2012 Conference on
Conference_Location :
Melbourne, VIC
ISSN :
1097-2137
Print_ISBN :
978-1-4673-3047-3
Type :
conf
DOI :
10.1109/COMMAD.2012.6472439
Filename :
6472439
Link To Document :
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