Pseudo-random sequences in analysis of polyvinylidene fluoride piezoelectric sensors

The ability to measure the force order of micronewtons with high accuracy is highly important in various applications of micromanipulation. Past studies have indicated that polyvinylidene fluoride (PVDF) piezoelectric sensors are the most promising tools with which to measure such forces. This paper presents fast and nondestructive frequency-domain methods with which to electrically characterize and analyze the properties of PVDF piezoelectric sensors. The maximum-length binary sequence (MLBS) is used as an excitation and the system-characterizing responses are measured through cross-correlation techniques. The results can be used to verify the feasibility of the applied PVDF in terms of resonance frequency, bandwidth, and other characterizing properties, which provides tools for more accurate force measurements. Experimental results are shown from a commercial PVDF polymer film.