• DocumentCode
    600248
  • Title

    Effect of Static Fault Current Limiter on distribution power quality

  • Author

    Najafi, Sina ; Sood, Vijay K. ; Hosny, A.

  • Author_Institution
    Fac. of Energy Syst. & Appl. Sci., Univ. of Ontario Inst. of Technol. (UOIT), Oshawa, ON, Canada
  • fYear
    2012
  • fDate
    10-12 Oct. 2012
  • Firstpage
    26
  • Lastpage
    31
  • Abstract
    High demand for sustainable electric energy makes the use of Distributed Generators (DGs) inevitable for future systems. However, introducing DGs into distribution networks increases fault current levels with potential for causing serious damage to power system apparatus. Increasingly, power quality during fault and recovery periods is also adversely affected. To alleviate these problems, a Static Fault Current Limiter (SFCL) is investigated in this work as a potential solution. The studied SFCL comprises a bridge rectifier with semiconductor switch IGBT bypassed by limiting inductor and ZnO Varistor. A case study of a 15-kV radial distribution system with SFCL located at the source end is simulated using EMTP-RV software. Simulation results following system faults show that the use of SFCL in distribution networks can efficiently suppress fault current magnitudes and enhance the power quality in terms of voltage sag.
  • Keywords
    distribution networks; fault current limiters; power apparatus; power supply quality; rectifiers; varistors; zinc compounds; DG; EMTP-RV software; IGBT; SFCL; ZnO; bridge rectifier; distributed generators; distribution networks; distribution power quality; inductor; power system apparatus; semiconductor switch IGBT; static fault current limiter EFFECT; sustainable electric energy; varistor; Circuit faults; Fault currents; Impedance; Inductors; Insulated gate bipolar transistors; Limiting; Power systems; Distribution Networks; Power Quality; Static Fault current limiter (SFCL);
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Power and Energy Conference (EPEC), 2012 IEEE
  • Conference_Location
    London, ON
  • Print_ISBN
    978-1-4673-2081-8
  • Electronic_ISBN
    978-1-4673-2079-5
  • Type

    conf

  • DOI
    10.1109/EPEC.2012.6474964
  • Filename
    6474964