DocumentCode
600277
Title
Predicting defect numbers based on defect state transition models
Author
Jue Wang ; Hongyu Zhang
Author_Institution
Sch. of Software, Tsinghua Univ., Beijing, China
fYear
2012
fDate
20-21 Sept. 2012
Firstpage
191
Lastpage
200
Abstract
During software maintenance, a large number of defects could be discovered and reported. A defect can enter many states during its lifecycle, such as NEW, ASSIGNED, and RESOLVED. The ability to predict the number of defects at each state can help project teams better evaluate and plan maintenance activities. In this paper, we present BugStates, a method for predicting defect numbers at each state based on defect state transition models. In our method, we first construct defect state transition models using historical data. We then derive a stability metric from the transition models to measure a project´s defect-fixing performance. For projects with stable defect-fixing performance, we show that we can apply Markovian method to predict the number of defects at each state in future based on the state transition model. We evaluate the effectiveness of BugStates using six open source projects and the results are promising. For example, when predicting defect numbers at each state in December 2010 using data from July 2009 to June 2010, the absolute errors for all projects are less than 28. In general, BugStates also outperforms other related methods.
Keywords
Markov processes; program debugging; project management; public domain software; software maintenance; BugStates; Markovian method; defect number prediction; defect state transition models; historical data; open source projects; project defect-fixing performance; software maintenance; stability metric; Computer bugs; Data mining; Data models; Markov processes; Measurement; Predictive models; Stability analysis; Markov models; defect numbers; defect prediction; defect state transitions; defect-fixing performance;
fLanguage
English
Publisher
ieee
Conference_Titel
Empirical Software Engineering and Measurement (ESEM), 2012 ACM-IEEE International Symposium on
Conference_Location
Lund
ISSN
1938-6451
Print_ISBN
978-1-4503-1056-7
Electronic_ISBN
1938-6451
Type
conf
DOI
10.1145/2372251.2372287
Filename
6475417
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