DocumentCode
600295
Title
A comparison of database fault detection capabilities using mutation testing
Author
McCormick, Donald W. ; Frakes, W.B. ; Anguswamy, R.
Author_Institution
Comput. Sci., Virginia Tech., Falls Church, VA, USA
fYear
2012
fDate
20-21 Sept. 2012
Firstpage
323
Lastpage
326
Abstract
Mutation testing involves systematically generating and introducing faults into an application to improve testing. A quasi-experimental study is reported comparing the fault-detection capabilities of realworld database application test suites to those of an SQL vendor test suite (NIST SQL) based on mutation scores. The higher the mutation score the more successful the test suite will be at detecting faults. The SQLMutation tool was used to generate query mutants from beginner-level sample schemas obtained from three popular real-world database test suite vendors - MySQL, SQL Server, and Oracle. Four SQLMutation operators were applied to both realworld and NIST SQL vendor compliance test suites - SQL Clause (SC), Operator Replacement (OR), NULL (NL) and Identifier Replacement (IR). Two mutation operators, SC and NL generated significantly lower mutation scores in real-world test suites than for those in the vendor test suite. The IR operator generated significantly higher mutation scores in real-world test suites than for those in the vendor test suite. The OR operator produced roughly the same mutation scores in both the real-world and vendor test suites.
Keywords
SQL; database management systems; fault tolerant computing; program testing; MySQL; NIST SQL suite; NULL; Oracle; SQL Server; SQL clause; SQL vendor test suite; SQLMutation tool; Structured Query Language; database fault detection capability; identifier replacement; mutation score; mutation testing; operator replacement; Databases; ISO standards; NIST; Servers; Software; Testing; SQL; database testing; mutation testing; test adequacy criteria;
fLanguage
English
Publisher
ieee
Conference_Titel
Empirical Software Engineering and Measurement (ESEM), 2012 ACM-IEEE International Symposium on
Conference_Location
Lund
ISSN
1938-6451
Print_ISBN
978-1-4503-1056-7
Electronic_ISBN
1938-6451
Type
conf
DOI
10.1145/2372251.2372310
Filename
6475435
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