Title :
Optimization of a self-converging algorithm at assembly level to improve SEU fault-tolerance
Author :
Marques-Costa, G. ; Mansour, Wassim ; Pancher, F. ; Velazco, Raoul ; Bui, Alain ; Sohier, D.
Author_Institution :
Lab. TIMA, Inst. Nat. Polytech. de Grenoble, Grenoble, France
fDate :
Feb. 27 2013-March 1 2013
Abstract :
The robustness with respect to SEUs (Single-Event Upset) of a self-converging algorithm is improved by fault-tolerance techniques implemented at software level. SEU-sensitivity evaluation was done by fault injection campaigns performed using a devoted test platform. Experimental results show that implementing fault-tolerance by modifying the assembly code leads to significant improvements of the fault tolerance.
Keywords :
fault tolerance; radiation hardening (electronics); SEU fault-tolerance improvement; SEU-sensitivity evaluation; assembly code modification; assembly level; fault injection campaigns; fault-tolerance technique; self-converging algorithm; single-event upset; software level; Assembly; Circuit faults; Fault tolerance; Fault tolerant systems; Field programmable gate arrays; Program processors; Registers; Assembly code; CEU (Code Emulated Upset); Fault injection; Fault tolerance; Self-converging algorithm; Self-stabilization; Single-event uptset (SEU); Triple Modular Redundancy;
Conference_Titel :
Circuits and Systems (LASCAS), 2013 IEEE Fourth Latin American Symposium on
Conference_Location :
Cusco
Print_ISBN :
978-1-4673-4897-3
DOI :
10.1109/LASCAS.2013.6519033
