Title :
Architectural Trace-Based Functional Coverage for Multiprocessor Verification
Author :
Mammo, Biruk ; Larimer, J. ; Morgan, Mark ; Fan, Deliang ; Hennenhoefer, E. ; Bertacco, Valeria
Abstract :
Functional coverage plays a pivotal role in assuring the quality of input stimuli used in the verification of modern digital designs. For an out-of-order multi-processor design, simulation of a detailed model of the design is often required to observe relevant design behaviors for functional coverage. However, since such a model is not available during the early phases of test development, verification teams are forced to wait until much later in the verification process to evaluate the quality of their test cases. Even then, the quality of the tests can be assured only on one specific design implementation - an undesirable characteristic for test and regression suites that are meant to be used across multiple generations and/or implementations of an architecture. This work addresses this issue by presenting a novel, implementation-independent, execution trace-based, coverage collection solution. Our solution enables the early evaluation of multi-processor tests using a high-level model of a design. In addition, it can be deployed with detailed design models, if desired, for further analysis alongside implementation-specific coverage models.
Keywords :
formal verification; integrated circuit design; integrated circuit testing; multiprocessing systems; regression analysis; architectural trace-based functional coverage; implementation-independent execution trace-based coverage collection solution; implementation-specific coverage models; input stimuli quality; modern digital design verification; multiprocessor tests; multiprocessor verification; out-of-order multiprocessor design; regression suites; test development; test suites; verification teams; ARM; functional coverage; memory consistency; multi-processor; verification;
Conference_Titel :
Microprocessor Test and Verification (MTV), 2012 13th International Workshop on
Conference_Location :
Austin, TX
Print_ISBN :
978-1-4673-4441-8
DOI :
10.1109/MTV.2012.12