DocumentCode :
602349
Title :
Mold compound selection study for CMOS90 176 lead LQFP 24×24mm package
Author :
Teng Seng Kiong ; Ruzaini, Ibrahim ; Serene Teh Seoh Hian
Author_Institution :
Freescale Semiconductor Malaysia Sdn. Bhd., 2, Jln. SS8/2, Free Industrial Zone Sungei Way, 47300 P.J. Selangor, Malaysia
fYear :
2012
fDate :
6-8 Nov. 2012
Firstpage :
1
Lastpage :
5
Abstract :
Semiconductor chip packages is getting more challenging nowadays with increase of I/O and lead counts, especially for thin and large body packages such as LQFP (Low Profile Quad Flat Packages) and TQFP (Thin Quad Flat Packages). Material selection for such package especially for automotive product is a key for qualification success and long term package reliability to meet industry requirement. This paper presents mold compound selection and development works done with several mold compound candidates from different mold compound suppliers, which include screening of candidates based on assembly output response, package reliability stress study as well as molding parameters optimization and establishment for selected mold compound for CMOS90 176 lead LQFP 24×24mm package. Mold compound properties of each compound candidate were studied.
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Manufacturing Technology Symposium (IEMT), 2012 35th IEEE/CPMT International
Conference_Location :
Ipoh, Perak, Malaysia
ISSN :
1089-8190
Print_ISBN :
978-1-4673-4384-8
Electronic_ISBN :
1089-8190
Type :
conf
DOI :
10.1109/IEMT.2012.6521769
Filename :
6521769
Link To Document :
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