• DocumentCode
    602371
  • Title

    Improvement journey of strip test sticky issue

  • Author

    Euclea Cheah Wuan Ning

  • Author_Institution
    Texas Instruments Malaysia Sdn. Bhd., 1, Lorong Enggang 33, Ampang/Ulu Klang 54200 Kuala Lumpur Malaysia
  • fYear
    2012
  • fDate
    6-8 Nov. 2012
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    Quite number of material was affected with sticky issue in an excursion which contributed to 0.10% yield drop. This excursion was caused by the presence of a strong bond between the UV tape and the device which made the device inseparable for tape and reel process. The study involves analysis of the root cause of the bonding layer as well as the measures taken to deal with the affected material and improvement actions done to qualify a new UV tape which does not have sticky issue. An alternate process was qualified to clear the affected material after thorough quality analysis was made. The yield and DPPM comparison of the UV tapes are taken into consideration to gauge the performance of the new UV tape while saving realized through qualification of the alternate process for sticky devices were discussed.
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Manufacturing Technology Symposium (IEMT), 2012 35th IEEE/CPMT International
  • Conference_Location
    Ipoh, Perak, Malaysia
  • ISSN
    1089-8190
  • Print_ISBN
    978-1-4673-4384-8
  • Electronic_ISBN
    1089-8190
  • Type

    conf

  • DOI
    10.1109/IEMT.2012.6521816
  • Filename
    6521816