DocumentCode :
602669
Title :
A 5 Gb/s 1/4-rate clock and data recovery circuit using dynamic stepwise bang-bang phase detector
Author :
Yen-Long Lee ; Soon-Jyh Chang ; Rong-Sing Chu ; Ying-Zu Lin ; Yen-Chi Chen ; Goh Jih Ren ; Chung-Ming Huang
Author_Institution :
Dept. of Electr. Eng., Nat. Cheng-Kung Univ., Tainan, Taiwan
fYear :
2012
fDate :
12-14 Nov. 2012
Firstpage :
141
Lastpage :
144
Abstract :
This paper presents a 5-Gb/s 1/4-rate clock and data recovery (CDR) circuit. The proposed dynamic stepwise bang-bang phase detector comprises the advantage of linear and bang-bang phase detectors. The CDR adjusts the charge pump currents and the interpolation weight of phase interpolators according to the phase error between input data and feedback clock. This CDR circuit was fabricated in TSMC 1P9M 90-nm CMOS technology. It consumes 16.8 mW from a 1.2-V supply and occupies an active area of 0.3 mm2. The measured peak-to-peak jitter and rms jitter of the recovered clock are 42.37 ps and 7.06 ps for a 5-Gb/s 27-1 PRBS, respectively. Moreover, the measured peak-to-peak jitter and rms jitter of the recovered data are 53.33 ps and 8.89 ps for a 5-Gb/s 27-1 PRBS, respectively.
Keywords :
CMOS digital integrated circuits; charge pump circuits; clock and data recovery circuits; interpolation; jitter; phase detectors; CDR circuit; TSMC CMOS technology; bit rate 5 Gbit/s; charge pump currents; clock and data recovery circuit; dynamic stepwise bang-bang phase detector; feedback clock; linear phase detector; measured peak-to-peak jitter; phase error; phase interpolator interpolation weight; power 16.8 mW; rms jitter; size 90 nm; time 42.37 ps; time 53.33 ps; time 7.06 ps; time 8.89 ps; voltage 1.2 V;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid State Circuits Conference (A-SSCC), 2012 IEEE Asian
Conference_Location :
Kobe
Type :
conf
DOI :
10.1109/IPEC.2012.6522645
Filename :
6522645
Link To Document :
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