• DocumentCode
    602965
  • Title

    Multi-trap RTN parameter extraction based on Bayesian inference

  • Author

    Awano, Hiromitsu ; Tsutsui, H. ; Ochi, Hiroshi ; Sato, Takao

  • Author_Institution
    Dept. of Commun. & Comput. Eng., Kyoto Univ., Kyoto, Japan
  • fYear
    2013
  • fDate
    4-6 March 2013
  • Firstpage
    597
  • Lastpage
    602
  • Abstract
    This paper presents a new analysis method for estimating the statistical parameters of random telegraph noise (RTN). RTN is characterized by the time constants of carrier capture and emission, and associated changes of threshold voltage. Because trap activities are projected on to the threshold voltage, the separation of time constants and amplitude for each trap is an ill-posed problem. The proposed method solves this problem by statistical method that can reflect the physical generation process of RTN. By using Gibbs sampling algorithm developed in statistical machine learning community, we decompose the measured threshold voltage sequence to time constants and amplitude of each trap. We also demonstrate that the proposed method estimates time constants about 2.1 times more accurately than the existing work that uses hidden Markov model, which contributes to enhance the accuracy of reliability-aware circuit simulation.
  • Keywords
    belief networks; circuit simulation; inference mechanisms; integrated circuit reliability; learning (artificial intelligence); parameter estimation; random noise; sampling methods; semiconductor device noise; Bayesian inference; Gibbs sampling algorithm; carrier capture; carrier emission; ill-posed problem; multitrap RTN parameter extraction; random telegraph noise; reliability-aware circuit simulation accuracy enhancement; statistical machine learning; statistical method; statistical parameter estimation; threshold voltage sequence decomposition; time constant estimation; Bayes methods; Electron traps; Hidden Markov models; Noise; Threshold voltage; Time measurement; Voltage measurement; Bayesian estimation; Device characterization; Random Telegraph Noise; Separation of multitrap activity;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Quality Electronic Design (ISQED), 2013 14th International Symposium on
  • Conference_Location
    Santa Clara, CA
  • ISSN
    1948-3287
  • Print_ISBN
    978-1-4673-4951-2
  • Type

    conf

  • DOI
    10.1109/ISQED.2013.6523672
  • Filename
    6523672