• DocumentCode
    602985
  • Title

    Easy-to-build Arbiter Physical Unclonable Function with enhanced challenge/response set

  • Author

    Ganta, D. ; Nazhandali, Leyla

  • Author_Institution
    Bradley Dept. of Electr. & Comput. Eng., Virginia Tech, Blacksburg, VA, USA
  • fYear
    2013
  • fDate
    4-6 March 2013
  • Firstpage
    733
  • Lastpage
    738
  • Abstract
    Physical Unclonable Functions (PUF) are novel chip identifiers with an extensive array of uses in security applications. In this paper, we propose a novel PUF that has a very large Challenge/Response (C/R) space in a given area, while being resistant to modeling attacks at the same time. We name this design S-ArbRO PUF. We study the variability of the proposed PUF and its reliability to temperature variations. In addition, we perform a modeling attack on the PUF to get an insight into its resistance to modeling. For an S-ArbRO PUF with 24 ring oscillators (ROs), we observe a variability of 46%, which is equivalent to the variability of a traditional RO PUF built out of the same ring oscillators. The proposed design is highly stable to temperature variations with a maximum of 4% bit flips at 65C. For an RO count of 24, the total number of C/R pairs in the design is over 63K, compared to 276 for a traditional RO PUF with the same number of ROs. S-ArbRO PUF is more secure as a logistic regression (LR)-based modeling attack requires a training set of over 47K C/R pairs to model with a 96% correct prediction, while an equivalent sized Arbiter PUF breaks at only 240 C/R pairs.
  • Keywords
    cryptography; oscillators; S-ArbRO PUF; arbiter physical unclonable functions; challenge-response set; chip identifiers; logistic regression; modeling attacks; process variations; ring oscillators; temperature variations; training set; Field programmable gate arrays; Mathematical model; Predictive models; Reliability; Resistance; Ring oscillators; Training; authentication; chip identifiers; modeling; physical unclonable functions; process variation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Quality Electronic Design (ISQED), 2013 14th International Symposium on
  • Conference_Location
    Santa Clara, CA
  • ISSN
    1948-3287
  • Print_ISBN
    978-1-4673-4951-2
  • Type

    conf

  • DOI
    10.1109/ISQED.2013.6523692
  • Filename
    6523692