• DocumentCode
    604869
  • Title

    Issues of finding a proper golden-reference sample for TIM tester calibration

  • Author

    Vass-Varnai, Andras ; Laky, S. ; Sarkany, Zoltan ; Barna, Cornel ; Rencz, Marta

  • Author_Institution
    Mech. Anal. Div., Mentor Graphics, Budapest, Hungary
  • fYear
    2013
  • fDate
    17-21 March 2013
  • Firstpage
    200
  • Lastpage
    205
  • Abstract
    In this paper we first describe a thermal interface material measurement methodology based on thermal transient testing. Measurement examples on different types of TIM materials are shown and guidelines are given, how the tests should be carried out to achieve the highest possible accuracy. Finally we give recommendations on what types of materials have proven for us to be the best candidates to be used in round-robin tests for the comparison of different test methodologies.
  • Keywords
    materials testing; thermal conductivity measurement; transient analysis; TIM tester calibration; golden-reference sample; round-robin tests; thermal interface material measurement methodology; thermal transient testing; Conductivity; Electrical resistance measurement; Materials; Temperature measurement; Thermal conductivity; Thermal resistance;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Semiconductor Thermal Measurement and Management Symposium (SEMI-THERM), 2013 29th Annual IEEE
  • Conference_Location
    San Jose, CA
  • ISSN
    1065-2221
  • Print_ISBN
    978-1-4673-6427-0
  • Electronic_ISBN
    1065-2221
  • Type

    conf

  • DOI
    10.1109/SEMI-THERM.2013.6526829
  • Filename
    6526829