DocumentCode
604869
Title
Issues of finding a proper golden-reference sample for TIM tester calibration
Author
Vass-Varnai, Andras ; Laky, S. ; Sarkany, Zoltan ; Barna, Cornel ; Rencz, Marta
Author_Institution
Mech. Anal. Div., Mentor Graphics, Budapest, Hungary
fYear
2013
fDate
17-21 March 2013
Firstpage
200
Lastpage
205
Abstract
In this paper we first describe a thermal interface material measurement methodology based on thermal transient testing. Measurement examples on different types of TIM materials are shown and guidelines are given, how the tests should be carried out to achieve the highest possible accuracy. Finally we give recommendations on what types of materials have proven for us to be the best candidates to be used in round-robin tests for the comparison of different test methodologies.
Keywords
materials testing; thermal conductivity measurement; transient analysis; TIM tester calibration; golden-reference sample; round-robin tests; thermal interface material measurement methodology; thermal transient testing; Conductivity; Electrical resistance measurement; Materials; Temperature measurement; Thermal conductivity; Thermal resistance;
fLanguage
English
Publisher
ieee
Conference_Titel
Semiconductor Thermal Measurement and Management Symposium (SEMI-THERM), 2013 29th Annual IEEE
Conference_Location
San Jose, CA
ISSN
1065-2221
Print_ISBN
978-1-4673-6427-0
Electronic_ISBN
1065-2221
Type
conf
DOI
10.1109/SEMI-THERM.2013.6526829
Filename
6526829
Link To Document