Title :
A novel BJT structure for high- performance analog circuit applications
Author :
Seon-Man Hwang ; Hyuk-Min Kwon ; Jae-hyung Jang ; Ho-Young Kwak ; Sung-Kyu Kwon ; Seung-Yong Sung ; Jong-Kwan Shin ; Jae-Nam Yu ; In-Shik Han ; Yi-Sun Chung ; Jung-Hwan Lee ; Ga-won Lee ; Hi-Deok Lee
Author_Institution :
Dept. of Electron. Eng., Chungnam Nat. Univ., Daejeon, South Korea
Abstract :
A novel structure is proposed to improve the matching characteristics of bipolar junction transistor (BJT) based on CMOS technology for high performance analog circuit applications. This paper includes the analysis of electrical and matching characteristics in collector current density (JC), base current density (JB) and current gain (β). Although the collector current density JC of the proposed structure is similar to that of the conventional structure, the base current density JB is lower than that of conventional structure, which results in higher current gain. The matching characteristics of the collector current density and the current gain of the proposed structure showed improvement of about 12.22% and 36.43%, respectively compared with the conventional structure.
Keywords :
CMOS integrated circuits; analogue integrated circuits; bipolar transistors; current density; BJT structure; CMOS technology; base current density; bipolar junction transistor; collector current density; current gain; high performance analog circuit applications; matching coefficient; Analog circuits; CMOS integrated circuits; CMOS technology; Conferences; Current density; Microelectronics; Performance evaluation; Analog application; Bipolar junction transistor (BJT); Matching coefficient; Mismatch; Novel structure;
Conference_Titel :
Microelectronic Test Structures (ICMTS), 2013 IEEE International Conference on
Conference_Location :
Osaka, Japan
Print_ISBN :
978-1-4673-4845-4
Electronic_ISBN :
1071-9032
DOI :
10.1109/ICMTS.2013.6528154
