DocumentCode
606193
Title
Time constant of the current drawn by the device and the corresponding noise for a given Power Delivery network
Author
Bhattacharyya, Bidyut K. ; Baral, Debasis
Author_Institution
Torit, San Jose, USA
fYear
2013
fDate
20-21 March 2013
Firstpage
22
Lastpage
25
Abstract
In this paper we have shown a method by which we can determine the relationship between the time constant of the current ramp by the device and the corresponding ground and power noise of any silicon device, for a given Power Delivery network. This relationship can be used for statistical analysis of the power delivery network.
Keywords
Capacitance; Integrated circuits; Noise; CPU Power; PDN; Power Delivery Network; Silicon Process; dI/dt. Time Constant; exponential rise time; noise in Silicon Chip;
fLanguage
English
Publisher
ieee
Conference_Titel
Circuits, Power and Computing Technologies (ICCPCT), 2013 International Conference on
Conference_Location
Nagercoil
Print_ISBN
978-1-4673-4921-5
Type
conf
DOI
10.1109/ICCPCT.2013.6528949
Filename
6528949
Link To Document