• DocumentCode
    60796
  • Title

    Gate Bias Adaptation of Doherty Power Amplifier for High Efficiency and High Power

  • Author

    Yunsik Park ; Juyeon Lee ; Seunghoon Jee ; Seokhyeon Kim ; Bumman Kim

  • Author_Institution
    Div. of IT Convergence Eng., Pohang Univ. of Sci. & Technol., Pohang, South Korea
  • Volume
    25
  • Issue
    2
  • fYear
    2015
  • fDate
    Feb. 2015
  • Firstpage
    136
  • Lastpage
    138
  • Abstract
    This letter presents an approach to maximize the output power and efficiency of a Doherty power amplifier (PA). The conventional carrier PA having 2ROPT match, used in a symmetric Doherty PA, does not deliver the saturated high efficiency at the 6 dB back-off power but at the 5.5 dB back-off power due to the knee voltage effect. To solve the problem, the gate biases of the carrier and peaking PAs are adapted. The gate bias voltage of the carrier PA is optimized for a higher peak output power, delivering a 3 dB larger peak power at ROPT match. That of the peaking PA is also optimized to have the same peak power of the carrier PA. A Doherty PA with the concept is designed using a 45 W gallium nitride (GaN) high electron mobility transistors (HEMT) for the carrier and peaking cells at 1.94 GHz. The measured average output power, drain/power-added efficiencies and gain are 44.35 dBm, 60.5/57.2%, and 12.75 dB for a 10 MHz long term evolution (LTE) signal with a 6.5 dB peak-to-average power ratio (PAPR).
  • Keywords
    HEMT circuits; III-V semiconductors; UHF power amplifiers; gallium compounds; wide band gap semiconductors; Doherty power amplifier; GaN; HEMT; LTE; Long Term Evolution signal; PAPR; carrier PA; efficiency 57.2 percent; efficiency 60.5 percent; frequency 1.94 GHz; gain 12.75 dB; gate bias adaptation; gate bias voltage; high electron mobility transistors; knee voltage effect; peak-to-average power ratio; power 45 W; symmetric Doherty PA; Gain; Gallium nitride; HEMTs; Logic gates; Long Term Evolution; Peak to average power ratio; Power generation; Drain efficiency (DE); Gallium nitride (GaN); long term evolution (LTE); power amplifier (PA);
  • fLanguage
    English
  • Journal_Title
    Microwave and Wireless Components Letters, IEEE
  • Publisher
    ieee
  • ISSN
    1531-1309
  • Type

    jour

  • DOI
    10.1109/LMWC.2014.2373637
  • Filename
    6967869