DocumentCode
608126
Title
Compact Model Council´s standard circuit simulator interface for reliability modeling
Author
Ramadan, Ahmed
Author_Institution
Mentor Graphics, Cairo, Egypt
fYear
2013
fDate
14-18 April 2013
Abstract
The Compact Model Council (CMC) commissioned a subcommittee to develop a standard in the area of reliability-induced aging modeling and simulation. The subcommittee proposed requirements for a standard application programming interface (API) for aging simulation. This paper presents the requirements of a simulation framework for reliability analysis of circuits in the SPICE environment.
Keywords
SPICE; ageing; application program interfaces; circuit reliability; circuit simulation; standards; API; CMC; Compact Model Council; SPICE environment; aging modeling; aging simulation; reliability modeling; standard application programming interface; standard circuit simulator interface; Aging; Analytical models; Degradation; Integrated circuit modeling; Integrated circuit reliability; Mathematical model; aging; cmc; compact model council; reliability;
fLanguage
English
Publisher
ieee
Conference_Titel
Reliability Physics Symposium (IRPS), 2013 IEEE International
Conference_Location
Anaheim, CA
ISSN
1541-7026
Print_ISBN
978-1-4799-0112-8
Electronic_ISBN
1541-7026
Type
conf
DOI
10.1109/IRPS.2013.6531945
Filename
6531945
Link To Document