DocumentCode
608156
Title
Technology scaling and reliability challenges in the multicore era
Author
Huard, Vincent ; Cacho, F. ; Federspiel, Xavier
Author_Institution
STMicroelectron., Crolles, France
fYear
2013
fDate
14-18 April 2013
Abstract
This work provides elements to highlight the reliability challenges related to the technology scaling in the multicore era. Through main milestones including device reliability scaling models, single-core scaling model and multicore chip organization and scaling models, the reliability impact on the speedup potential of multiprocessors for a set of parallel real workloads is assessed. The main conclusion of this study is to highlight the fact that the “free lunch” for overdrive conditions is soon to be over.
Keywords
integrated circuit modelling; integrated circuit reliability; microprocessor chips; multiprocessing systems; device reliability scaling model; microprocessor; multicore chip organization; multicore era; multiprocessor; parallel real workload set; single-core scaling model; technology scaling; Benchmark testing; Degradation; Multicore processing; Performance evaluation; Reliability; Threshold voltage; Topology; AVS; DVFS; aged models; failure rate; gate-level models; guardband; microprocessor; multicore; parallel workload; product qualification; reliability; wireless application;
fLanguage
English
Publisher
ieee
Conference_Titel
Reliability Physics Symposium (IRPS), 2013 IEEE International
Conference_Location
Anaheim, CA
ISSN
1541-7026
Print_ISBN
978-1-4799-0112-8
Electronic_ISBN
1541-7026
Type
conf
DOI
10.1109/IRPS.2013.6531975
Filename
6531975
Link To Document