• DocumentCode
    608156
  • Title

    Technology scaling and reliability challenges in the multicore era

  • Author

    Huard, Vincent ; Cacho, F. ; Federspiel, Xavier

  • Author_Institution
    STMicroelectron., Crolles, France
  • fYear
    2013
  • fDate
    14-18 April 2013
  • Abstract
    This work provides elements to highlight the reliability challenges related to the technology scaling in the multicore era. Through main milestones including device reliability scaling models, single-core scaling model and multicore chip organization and scaling models, the reliability impact on the speedup potential of multiprocessors for a set of parallel real workloads is assessed. The main conclusion of this study is to highlight the fact that the “free lunch” for overdrive conditions is soon to be over.
  • Keywords
    integrated circuit modelling; integrated circuit reliability; microprocessor chips; multiprocessing systems; device reliability scaling model; microprocessor; multicore chip organization; multicore era; multiprocessor; parallel real workload set; single-core scaling model; technology scaling; Benchmark testing; Degradation; Multicore processing; Performance evaluation; Reliability; Threshold voltage; Topology; AVS; DVFS; aged models; failure rate; gate-level models; guardband; microprocessor; multicore; parallel workload; product qualification; reliability; wireless application;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Reliability Physics Symposium (IRPS), 2013 IEEE International
  • Conference_Location
    Anaheim, CA
  • ISSN
    1541-7026
  • Print_ISBN
    978-1-4799-0112-8
  • Electronic_ISBN
    1541-7026
  • Type

    conf

  • DOI
    10.1109/IRPS.2013.6531975
  • Filename
    6531975