DocumentCode
608177
Title
Design for reliability through engineering optimization
Author
Wee Loon Ng ; Yong Chiang Ee ; Kin Leong Pey ; Chuan Seng Tan
Author_Institution
GLOBALFOUNDRIES Singapore Pte Ltd., Singapore, Singapore
fYear
2013
fDate
14-18 April 2013
Abstract
With complex process integration approaches and severe fabrication limitations caused by the introduction of new materials and diminishing process margins, there are mounting concerns over possible increased failure rate [1] at the early life cycle (e.g. <;1 year operation) of product use, known as infant mortality failures. A paradigm change in reliability qualification methodology, to aim at understanding the impact of variations on reliability [2-3], is required to ensure that reliability robustness is integrated into the design of the technology to prevent problems from surfacing during product qualification and application. By applying the improved variation control though process Design-For-Reliability (DFR) and engineering optimization methodology as described in Figure 2 and Figure 3, this work aims to establish an effective and efficient method to reduce the infant mortality failure rate of the product, through understanding critical design and process factors and determining the optimal design and process conditions to ensure reliability robustness.
Keywords
failure analysis; optimisation; reliability; semiconductor industry; DFR process; complex process integration approaches; design-for-reliability process; diminishing process margins; engineering optimization; engineering optimization methodology; failure rate; improved variation control; mortality failures; process factors; product qualification; reliability design; reliability qualification methodology; reliability robustness; Metals; Qualifications; Reliability engineering; Robustness; Semiconductor device reliability; Transistors;
fLanguage
English
Publisher
ieee
Conference_Titel
Reliability Physics Symposium (IRPS), 2013 IEEE International
Conference_Location
Anaheim, CA
ISSN
1541-7026
Print_ISBN
978-1-4799-0112-8
Electronic_ISBN
1541-7026
Type
conf
DOI
10.1109/IRPS.2013.6531996
Filename
6531996
Link To Document