DocumentCode
608205
Title
Open localization on copper wirebond using Space Domain Reflectometry
Author
Gaudestad, J. ; Talanov, V.V. ; Orozco, Alvaro ; Khai Ling Khoo
Author_Institution
Neocera, LLC, Beltsville, MD, USA
fYear
2013
fDate
14-18 April 2013
Abstract
Space Domain Reflectometry (SDR) is a new technique that has already shown to be a reliable non-destructive method to image open failures in semiconductor chips by pumping a high frequency signal into the open trace. We show in this paper that SDR can be used to accurately find a breakage location in copper wire bond that failed during stress test.
Keywords
copper; lead bonding; reflectometry; semiconductor device reliability; SDR; breakage location; copper wirebond reliability; high frequency signal; image open failures; nondestructive method; open localization; open trace; semiconductor chips; space domain reflectometry; stress test; Magnetic fields; Magnetic sensors; Radio frequency; Reflectometry; SQUIDs; Wires; SDR; magnetic current imaging; non-destructive; open;
fLanguage
English
Publisher
ieee
Conference_Titel
Reliability Physics Symposium (IRPS), 2013 IEEE International
Conference_Location
Anaheim, CA
ISSN
1541-7026
Print_ISBN
978-1-4799-0112-8
Electronic_ISBN
1541-7026
Type
conf
DOI
10.1109/IRPS.2013.6532024
Filename
6532024
Link To Document