Title :
Single-event transient measurement on a DC/DC PWM controller using Pulsed X-ray technique
Author :
Ren, Yi ; Chen, Luo-nan ; Shi, S. ; Guo, G. ; Feng, Renhai ; Wen, Shuli ; Wong, Rita ; van Vonno, N. ; Bhuva, B.L.
Author_Institution :
Electr. & Comput. Eng., Univ. of Saskatchewan, Saskatoon, SK, Canada
Abstract :
Pulsed X-rays were used to perform Single-Event Transient (SET) measurements on a COTS DC/DC PWM controller. The results were consistent with those of the previous heavy ion and pulsed laser testings, which indicates that the pulsed X-ray technique is a complementary tool to investigate SET. However, there are some limitations, such as low energy absorption of X-rays in silicon and total ionizing dose (TID) effects due to the X-ray irradiation, which need to be considered during X-ray applications.
Keywords :
DC-DC power convertors; PWM power convertors; X-ray absorption; X-ray effects; X-ray lasers; elemental semiconductors; ionisation; silicon; COTS DC-DC PWM converter controller; SET; Si; TID; X-ray irradiation; heavy ion testing; low energy absorption; pulsed X-ray technique; pulsed laser testing; single-event transient measurement; total ionizing dose effect; Absorption; Laser beams; Laser theory; Pulse width modulation; Radiation effects; Testing; X-ray lasers; DC/DC Converter; Heavy Ion; Pulse-Width Modulator (PWM); Pulsed Laser; Pulsed X-ray Technique; Single-Event Transient;
Conference_Titel :
Reliability Physics Symposium (IRPS), 2013 IEEE International
Conference_Location :
Anaheim, CA
Print_ISBN :
978-1-4799-0112-8
Electronic_ISBN :
1541-7026
DOI :
10.1109/IRPS.2013.6532110
