DocumentCode
60848
Title
Reliability-Aware Synthesis of Combinational Logic With Minimal Performance Penalty
Author
Limbrick, Daniel B. ; Mahatme, N.N. ; Robinson, William H. ; Bhuva, B.L.
Author_Institution
Sch. of Electr. & Comput. Eng., Georgia Inst. of Technol., Atlanta, GA, USA
Volume
60
Issue
4
fYear
2013
fDate
Aug. 2013
Firstpage
2776
Lastpage
2781
Abstract
Strategies to mitigate soft errors in combinational logic have resulted in large performance penalties and increases in design time. This study alleviates these issues by using standard cells to selectively harden vulnerable nodes in combinational logic. Results indicate that replacing two-input gates with four-input equivalents reduces pulse widths by 5%-20% with less than 1% power overhead. Additionally, this paper demonstrates reliability gains that can be made at the synthesis level under tight performance constraints.
Keywords
combinational circuits; integrated circuit design; integrated circuit reliability; combinational logic; four-input gates; minimal performance penalty; performance constraints; reliability-aware synthesis; soft error mitigation; standard cells; Capacitance; Delay; Integrated circuit reliability; MOSFETs; Transient analysis; Combinational logic; pulse width; reliability-aware synthesis; single event transient; soft error;
fLanguage
English
Journal_Title
Nuclear Science, IEEE Transactions on
Publisher
ieee
ISSN
0018-9499
Type
jour
DOI
10.1109/TNS.2013.2240699
Filename
6464537
Link To Document