• DocumentCode
    609643
  • Title

    Timing-aware clock gating of pulsed-latch circuits for low power design

  • Author

    Zong-Han Yang ; Tsung-Yi Ho

  • Author_Institution
    Dept. of Comput. Sci. & Inf. Eng., Nat. Cheng Kung Univ., Tainan, Taiwan
  • fYear
    2013
  • fDate
    22-24 April 2013
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    Low power design is a crucial issue in modern circuit design. Several techniques have been developed to save power consumption. Of those techniques, the pulsed-latch technologies replace flip-flops with pulsed latches due to smaller capacitance of the latter. Additionally, the clock gating of pulsed-latch circuit, which is called pulser gating, has been developed recently to further reduce power consumption. However, pulser gating may incur a timing violation in the clock gating cell, making it impossible to operate the pulser gating correctly, and ultimately causing a fatal error in the circuits. Therefore, this work propose an algorithm to resolve the problem of pulser gating and timing constraints simultaneously. We use a line-search algorithm to determine gate location to satisfy the timing constraint and apply the minimum-cost maximum-flow network to globally determine the clock-tree topology of pulsed-latch circuits. Experimental results indicate that the proposed algorithm can reduce power consumption with timing constraint effectively compared to state-of-the-art proposed.
  • Keywords
    clocks; design engineering; flip-flops; low-power electronics; pulse circuits; capacitance; clock gating cell; clock tree topology; flip flops; gate location; line search algorithm; low power design; maximum flow network; modern circuit design; power consumption; pulsed latch circuit; pulsed latch technology; pulser gating; timing aware clock gating; timing constraint; timing violation; Clocks; Clustering algorithms; Delays; Latches; Power demand; Time factors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Design, Automation, and Test (VLSI-DAT), 2013 International Symposium on
  • Conference_Location
    Hsinchu
  • Print_ISBN
    978-1-4673-4435-7
  • Type

    conf

  • DOI
    10.1109/VLDI-DAT.2013.6533819
  • Filename
    6533819