• DocumentCode
    612268
  • Title

    Architecture level TSV count minimization methodology for 3D tree-based FPGA

  • Author

    Pangracious, Vinod ; Mehrez, H. ; Marakchi, Z.

  • Author_Institution
    LIP6, Univ. of Pierre & Marie Curie Paris, Paris, France
  • fYear
    2013
  • fDate
    17-19 April 2013
  • Firstpage
    1
  • Lastpage
    3
  • Abstract
    The CMOS technology scaling has greatly improved the overall performance and density of Field Programmable Gate Array (FPGA), nonetheless the performance gap between FPGA and ASIC has remain very wide mainly due the programming overhead of FPGA. Three-Dimensional (3D) integration is a promising technology to reduce wire lengths. Through Silicon Vias (TSV) provide electrical connectivity between multiple active device planes in 3D integrated Circuits (ICs). TSVs require a significant silicon area compared to planar interconnects and also bring critical challenges to design of 3D ICs. In this paper we propose an architectural level TSV count optimization solution to minimize the TSV count without compromising the chip performance. The experimental results shows we are able to minimize 40% of TSV count in 3D Tree-based FPGA.
  • Keywords
    CMOS digital integrated circuits; application specific integrated circuits; field programmable gate arrays; three-dimensional integrated circuits; 3D IC; 3D integrated circuits; 3D tree-based FPGA; ASIC; CMOS technology scaling; architecture level TSV count minimization methodology; electrical connectivity; field programmable gate array; multiple active device planes; performance gap; planar interconnects; programming overhead; three-dimensional integration; through silicon vias; wire lengths reduction; Computer architecture; Field programmable gate arrays; Integrated circuit interconnections; Optimization; Switches; Three-dimensional displays; Through-silicon vias;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Cool Chips XVI (COOL Chips), 2013 IEEE
  • Conference_Location
    Yokohama
  • Print_ISBN
    978-1-4673-5780-7
  • Electronic_ISBN
    978-1-4673-5781-4
  • Type

    conf

  • DOI
    10.1109/CoolChips.2013.6547925
  • Filename
    6547925