مرکز منطقه ای اطلاع رساني علوم و فناوري

DocumentCode :

612967

Title :

[Title page]

fYear :

2013

fDate :

April 29 2013-May 2 2013

Firstpage :

Lastpage :

Abstract :

Presents the title pages of the 2013 IEEE 31st VLSI Test Symposium (VTS) proceedings record.

fLanguage :

English

Publisher :

ieee

Conference_Titel :

VLSI Test Symposium (VTS), 2013 IEEE 31st

Conference_Location :

Berkeley, CA, USA

ISSN :

1093-0167

Print_ISBN :

978-1-4673-5542-1

Type :

conf

DOI :

10.1109/VTS.2013.6548871

Filename :

6548871

Link To Document :