Title :
Distributed dynamic partitioning based diagnosis of scan chain
Author :
Yu Huang ; Xiaoxin Fan ; Huaxing Tang ; Sharma, Mukesh ; Wu-Tung Cheng ; Benware, Brady ; Reddy, S.M.
Author_Institution :
Mentor Graphics, Wilsonville, OR, USA
fDate :
April 29 2013-May 2 2013
Abstract :
Diagnosis memory footprint for large designs is growing as design sizes grow such that the diagnosis throughput for given computational resources becomes a bottleneck in volume diagnosis. In this paper, we propose a scan chain diagnosis flow based on dynamic design partitioning and distributed diagnosis architecture that can improve the diagnosis throughput over one order of magnitude.
Keywords :
fault diagnosis; integrated circuit design; integrated memory circuits; computational resources; diagnosis memory footprint; distributed dynamic partitioning based diagnosis; dynamic design partitioning; scan chain diagnosis flow; volume diagnosis; Accuracy; Circuit faults; Computer architecture; Heuristic algorithms; Loading; Logic gates; Throughput;
Conference_Titel :
VLSI Test Symposium (VTS), 2013 IEEE 31st
Conference_Location :
Berkeley, CA
Print_ISBN :
978-1-4673-5542-1
DOI :
10.1109/VTS.2013.6548916