Novel model calibration method based on differential evolution used for SCR model fitting

This paper presents the possibility to use modern and very effective optimization algorithm called differential evolutionary optimization algorithm (DEOA) enhanced by Nelder-Mead Simplex algorithm (NMSA) for fully automatic ESD protection model calibration. This novel method requires only TLP measurement of specific protection device for optimal model calibration. Presented approach is currently being actively developed by authors and tested for various ESD protection devices to verify its robustness. It was in past successfully tested on electrostatic discharge (ESD) MOSFET [1]. Description of used macro-model and novel calibration method along with results of ESD Silicon-controlled rectifier (SCR) macro-model calibration to empirical data are presented.