• DocumentCode
    614929
  • Title

    Recent advances in memory technology

  • Author

    James, Doug

  • Author_Institution
    Chipworks Inc., Ottawa, ON, Canada
  • fYear
    2013
  • fDate
    14-16 May 2013
  • Firstpage
    386
  • Lastpage
    395
  • Abstract
    In the last five years we have seen remarkable advances in the density of commodity memory devices, both NAND flash and DRAM. NAND flash has now migrated to the 1x-nm era, and DRAM is has reached the 2x-nm node. To achieve this level of integration the manufacturers have had to adopt both new materials and processes, and also were the first users of advanced lithographic techniques such as immersion lithography and double patterning. Chipworks, as a supplier of competitive intelligence to the semiconductor and electronics industries, monitors the evolution of chip processes as they come into commercial production. Chipworks has obtained parts from the leading edge manufacturers, and performed structural analyses to examine the features and manufacturing processes of the devices. The paper reviews some of the different flash and DRAM memory structures produced recently, and looks at the details of the memory cells.
  • Keywords
    DRAM chips; flash memories; immersion lithography; semiconductor device manufacture; Chipworks; DRAM; NAND flash; advanced lithographic techniques; commodity memory devices; double patterning; immersion lithography; memory technology; Air gaps; Dielectrics; Flash memories; Logic gates; Metals; Nonvolatile memory; Random access memory; DRAM; embedded memory; flash memory; memory;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Advanced Semiconductor Manufacturing Conference (ASMC), 2013 24th Annual SEMI
  • Conference_Location
    Saratoga Springs, NY
  • ISSN
    1078-8743
  • Print_ISBN
    978-1-4673-5006-8
  • Type

    conf

  • DOI
    10.1109/ASMC.2013.6552766
  • Filename
    6552766