DocumentCode
614929
Title
Recent advances in memory technology
Author
James, Doug
Author_Institution
Chipworks Inc., Ottawa, ON, Canada
fYear
2013
fDate
14-16 May 2013
Firstpage
386
Lastpage
395
Abstract
In the last five years we have seen remarkable advances in the density of commodity memory devices, both NAND flash and DRAM. NAND flash has now migrated to the 1x-nm era, and DRAM is has reached the 2x-nm node. To achieve this level of integration the manufacturers have had to adopt both new materials and processes, and also were the first users of advanced lithographic techniques such as immersion lithography and double patterning. Chipworks, as a supplier of competitive intelligence to the semiconductor and electronics industries, monitors the evolution of chip processes as they come into commercial production. Chipworks has obtained parts from the leading edge manufacturers, and performed structural analyses to examine the features and manufacturing processes of the devices. The paper reviews some of the different flash and DRAM memory structures produced recently, and looks at the details of the memory cells.
Keywords
DRAM chips; flash memories; immersion lithography; semiconductor device manufacture; Chipworks; DRAM; NAND flash; advanced lithographic techniques; commodity memory devices; double patterning; immersion lithography; memory technology; Air gaps; Dielectrics; Flash memories; Logic gates; Metals; Nonvolatile memory; Random access memory; DRAM; embedded memory; flash memory; memory;
fLanguage
English
Publisher
ieee
Conference_Titel
Advanced Semiconductor Manufacturing Conference (ASMC), 2013 24th Annual SEMI
Conference_Location
Saratoga Springs, NY
ISSN
1078-8743
Print_ISBN
978-1-4673-5006-8
Type
conf
DOI
10.1109/ASMC.2013.6552766
Filename
6552766
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