DocumentCode
614955
Title
Practical aspects of virtual metrology and predictive maintenance model development and optimization
Author
Schopka, U. ; Roeder, G. ; Mattes, A. ; Schellenberger, Martin ; Pfeffer, M. ; Pfitzner, Lothar ; Scheibelhofer, P.
Author_Institution
Fraunhofer Inst. for Integrated Syst. & Device Technol. (IISB), Erlangen, Germany
fYear
2013
fDate
14-16 May 2013
Firstpage
180
Lastpage
185
Abstract
This paper describes practical aspects of development and implementation of novel process control entities such as Virtual Metrology (VM) and Predictive Maintenance (PdM), which utilize multivariate statistical models and machine learning techniques for prediction of process quality parameters and equipment faults. The description is based on the experiences collected during model development for VM and PdM. An overview of the main development steps including main challenges, potential solutions and applicable algorithms is given. The implementation of the steps is described at the example of the prediction of the filament breakdown in an implanter ion source.
Keywords
control engineering computing; ion sources; learning (artificial intelligence); maintenance engineering; process control; production engineering computing; statistical analysis; PdM; VM; applicable algorithms; equipment faults; filament breakdown; implanter ion source; machine learning techniques; main challenges; main development steps; multivariate statistical models; potential solutions; predictive maintenance model development; process control entities; process quality parameters; virtual metrology; Data models; Degradation; Maintenance engineering; Noise; Prediction algorithms; Predictive models; Process control; Advanced Process Control; Predictive Maintenance; Virtual Metrology; data mining; machine learning; process control; statistical modeling;
fLanguage
English
Publisher
ieee
Conference_Titel
Advanced Semiconductor Manufacturing Conference (ASMC), 2013 24th Annual SEMI
Conference_Location
Saratoga Springs, NY
ISSN
1078-8743
Print_ISBN
978-1-4673-5006-8
Type
conf
DOI
10.1109/ASMC.2013.6552793
Filename
6552793
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