• DocumentCode
    614955
  • Title

    Practical aspects of virtual metrology and predictive maintenance model development and optimization

  • Author

    Schopka, U. ; Roeder, G. ; Mattes, A. ; Schellenberger, Martin ; Pfeffer, M. ; Pfitzner, Lothar ; Scheibelhofer, P.

  • Author_Institution
    Fraunhofer Inst. for Integrated Syst. & Device Technol. (IISB), Erlangen, Germany
  • fYear
    2013
  • fDate
    14-16 May 2013
  • Firstpage
    180
  • Lastpage
    185
  • Abstract
    This paper describes practical aspects of development and implementation of novel process control entities such as Virtual Metrology (VM) and Predictive Maintenance (PdM), which utilize multivariate statistical models and machine learning techniques for prediction of process quality parameters and equipment faults. The description is based on the experiences collected during model development for VM and PdM. An overview of the main development steps including main challenges, potential solutions and applicable algorithms is given. The implementation of the steps is described at the example of the prediction of the filament breakdown in an implanter ion source.
  • Keywords
    control engineering computing; ion sources; learning (artificial intelligence); maintenance engineering; process control; production engineering computing; statistical analysis; PdM; VM; applicable algorithms; equipment faults; filament breakdown; implanter ion source; machine learning techniques; main challenges; main development steps; multivariate statistical models; potential solutions; predictive maintenance model development; process control entities; process quality parameters; virtual metrology; Data models; Degradation; Maintenance engineering; Noise; Prediction algorithms; Predictive models; Process control; Advanced Process Control; Predictive Maintenance; Virtual Metrology; data mining; machine learning; process control; statistical modeling;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Advanced Semiconductor Manufacturing Conference (ASMC), 2013 24th Annual SEMI
  • Conference_Location
    Saratoga Springs, NY
  • ISSN
    1078-8743
  • Print_ISBN
    978-1-4673-5006-8
  • Type

    conf

  • DOI
    10.1109/ASMC.2013.6552793
  • Filename
    6552793