• DocumentCode
    615084
  • Title

    Explicit occlusion detection based deformable fitting for facial landmark localization

  • Author

    Xiang Yu ; Fei Yang ; Junzhou Huang ; Metaxas, Dimitris N.

  • Author_Institution
    Dept. of Comput. Sci., Rutgers Univ., Piscataway, NJ, USA
  • fYear
    2013
  • fDate
    22-26 April 2013
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    This paper addresses the problem of facial landmark localization on partially occluded faces. We proposes an explicit occlusion detection based deformable fitting model for occluded landmark localization. Most recent shape registration methods apply landmark local search and attempt to simultaneously minimize both the model error and localization error. However, if part of the shape is occluded, those methods may lead to misalignment. In this paper, we introduce regression based occlusion detection to restrict the occluded landmarks´ error propagation from passing to the overall optimization. Assuming the parameter model being Gaussian, we propose a weighted deformable fitting algorithm that iteratively approaches the optima. Experimental results in our synthesized facial occlusion database demonstrate the advantage of our method.
  • Keywords
    Gaussian processes; curve fitting; face recognition; hidden feature removal; optimisation; regression analysis; search problems; shape recognition; solid modelling; Gaussian process; deformable fitting model; explicit occlusion detection; facial landmark localization; landmark local search; localization error; model error; occluded landmark localization; occluded landmarks error propagation; overall optimization; parameter model; partially occluded faces; regression based occlusion detection; shape registration methods; synthesized facial occlusion database; weighted deformable fitting algorithm; Deformable models; Facial animation; Fitting; Mouth; Nose; Shape; Vectors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Automatic Face and Gesture Recognition (FG), 2013 10th IEEE International Conference and Workshops on
  • Conference_Location
    Shanghai
  • Print_ISBN
    978-1-4673-5545-2
  • Electronic_ISBN
    978-1-4673-5544-5
  • Type

    conf

  • DOI
    10.1109/FG.2013.6553723
  • Filename
    6553723