Title :
Outage probability and BER of switch-and-stay combining in two-way relay systems with analog network coding
Author :
Lei, Xianfu ; Fan, Lisheng ; Fan, Pingzhi ; Hu, Rose Qingyang ; Wang, Xian
Author_Institution :
Department of Electrical & Computer Engineering, Utah State University, USA
Abstract :
In this paper, switch-and-stay combining (SSC) is considered in two-way relay systems with amplify-and-forward (AF) relays, among which one is activated to assist the information exchange between two sources. We assume that the two-way relay system operates in the analog network coding (ANC) protocol where the communication can only be achieved through the active relay without the direct link. The outage probability and the average bit error rate (BER) for Rayleigh fading channels are studied. In particular, we derive closed-form lower bounds for the outage probability and the average BER, which is tight for different fading conditions. Moreover, we present asymptotic analysis for both the outage probability and the average BER at high signal-to-noise ratio (SNR) region. It is shown that SSC can achieve the full diversity order in two-way relay systems with proper switching thresholds. Numerical and simulation results are also provided to verify the theoretical study.
Keywords :
Bit error rate; Educational institutions; Fading; Protocols; Relays; Signal to noise ratio; Switches;
Conference_Titel :
Wireless Communications and Networking Conference (WCNC), 2013 IEEE
Conference_Location :
Shanghai, Shanghai, China
Print_ISBN :
978-1-4673-5938-2
Electronic_ISBN :
1525-3511
DOI :
10.1109/WCNC.2013.6555109