Title :
Outage and symbol error probabilities of dual-hop AF relaying in a Poisson field of interferers
Author :
Guidotti, A. ; Buccigrossi, Valentina ; Di Renzo, Marco ; Corazza, Giovanni Emanuale ; Santucci, Fortunato
Author_Institution :
Dept. of Electr., Electron., & Inf. Eng. (DEI), Univ. of Bologna, Bologna, Italy
Abstract :
In this paper, we introduce a new framework to compute the Outage Probability (Pout) and the Average Symbol Error Probability (ASEP) of dual-hop Amplify-and-Forward (AF) relaying in the presence of noise, fading, and network interference. The interfering nodes are randomly distributed in the 2D Euclidean plane according to a homogeneous Poisson point process. Our framework provides closed-form expressions of Pout and ASEP over Rayleigh fading channels, additive noise at the relay and at the destination, and network interference at the destination. The accuracy of our analytical derivation is substantiated through extensive Monte Carlo simulations.
Keywords :
Monte Carlo methods; Rayleigh channels; amplify and forward communication; probability; radiofrequency interference; 2D Euclidean plane; Poisson field; Rayleigh fading channels; additive noise; dual-hop AF relaying; dual-hop amplify-and-forward relaying; extensive Monte Carlo simulations; homogeneous Poisson point process; interfering nodes; network interference; outage probability; symbol error probability; Base stations; Fading; Interference; Modulation; Relays; Signal to noise ratio;
Conference_Titel :
Wireless Communications and Networking Conference (WCNC), 2013 IEEE
Conference_Location :
Shanghai
Print_ISBN :
978-1-4673-5938-2
Electronic_ISBN :
1525-3511
DOI :
10.1109/WCNC.2013.6555163